Edited By: T Sakurai and Watanabe
341 pages, Figs
This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
There are currently no reviews for this product. Be the first to review this product!
Your orders support book donation projects
NHBS is one of my favorite vendors.
Search and browse over 110,000 wildlife and science products
Multi-currency. Secure worldwide shipping
Wildlife, science and conservation since 1985