This unique volume provides comprehensive coverage of the theories and techniques of elastic and inelastic electron diffraction and imaging as well as their applications in quantitative structure determination using transmission and scanning transmission electron microscopy. The author summarizes principles, techniques, and applications in his discussions of thermal diffusely scattered, valence-loss, and atomic inner-shell scattered electrons in compositional sensitive imaging.
'This is an excellent and comprehensive book describing the theory of the elastic and inelastic scattering of the electrons by crystals...This book fills a gap in the existing books on electron microscopy because it discusses in considerable depth inelastic scattering in electron diffraction and microscopy...very useful both as a textbook and as a reference book...comprehensive and right up to date...suitable for scientists ranging from research students to real experts in the field.' Journal of Microscopy 'Without question this book, particularly the treatment of inelastic scattering, is a noteworthy achievement and a valuable contribution to the literature.' American Scientist
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