Part I Statistics in Research and Development: Guidelines for selecting factors and factor levels for an industrial designed experiment, V. Czitrom; Industrial Experimentation for screening, D.J.K. Lin; The planing and analysis of industrial selection and screening experiments, G. Pan, T.J. Santner, D.M. Goldman; Uniform experimental designs and their applications in industry, K.T. Fang, D.K.J. Lin; Mixed Models and repeated measures - some illustrative industrial examples, G.A. Milliken; Current modeling and design issues in response surface methodology - GLMs and models with block effects, A.I. Khuri; A review of design and modeling in computer experiments, V.C.P. Chen, K.L. Tsui, R.R. Barton, J.K. Allen; Quality improvement and robustness via design of experiments, B.E. Ankenman, A.M. Dean; Software to support manufacturing experiments, J.C. Reece; Statistics in semiconductor industry, V. Czitrom; PREDICT - A new approach to product development and life time assessment using information integration technology, J.M. Booker, T.R. Bement, M.A. Meyer, W.J. Kerscher III; Promises and challenges of mining web transaction data, S.R. Dalal, D. Egan, Y. Ho, M. Rosentein. Part II Statistics In On-line Industrial Processes: Control chart schemes for monitoring the mean and variance of the processes subject to sustained shifts and drifts, Z.G. Stoumbos, M.R. Reynolds Jr., W.H. Woodall; Multivariate Control Charts - Hotelling-T-square, Data Depth and Beyong, R.Y. Liu; Sample sizes effective for T2 control charts, R.L. Mason, Y.M. Chou, J.C. Young; Multidimensional scaling in process control, T.F. Cox; Quantifying the capability of industrial processes, A.M. Polansky, S.N.U.A. Kirmani; Taguchi's approach to on line control procedure, M.S. Srivastava, Y. Wu; Dead bank adjustment schemes for on line feedback quality control, A. Lueno.