Books  Data Analysis & Modelling  Cartography, Remote Sensing, Image Analysis & GIS 

Quality Aspects in Spatial Data Mining

By: Alfred Stein, John Shi and Wietske Bijker

CRC Press

Hardback | Aug 2008 | #175572 | ISBN-13: 9781420069266
Availability: Usually dispatched within 6 days Details
NHBS Price: £76.99 $98/€92 approx

About this book

Both end users and researchers are eager to develop more sophisticated ways to quantify, model, and visualize spatial data. In this cohesive collection of peer-reviewed chapters, respected international researchers present the latest advancements, covering data acquisition, geoinformation theory, spatial statistics, and dissemination.

Stressing practical considerations, a significant portion of the text is dedicated to a number of data quality applications. Many of these demonstrate how the needs of users trigger new scientific developments. Each chapter is introduced by the editors, who, along with the contributors, look at each topic from a conceptual, applied, and methodological point of view.


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