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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

By: Zhong Liu Wang

436 pages, Figs, tabs

Cambridge University Press

Hardback | May 1996 | #51684 | ISBN: 0521482666
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NHBS Price: £117.00 $143/€132 approx

About this book

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

'A very complete review of all work performed in reflection electron microscopy with an exhaustive bibliography ! It forms an exciting support for the understanding of surface studies by reflection electron microscopy. Illustrated by many beautiful and pertinent REM images and well-designed line drawings, this book should certainly be useful for graduate students and scientists working on surface characterization.' Andre Rocher, Measurement Science & Technology 'For those with a TEM background it represents, perhaps, the definitive text for reflection methods ! extremely readable ! attractive style ! Dr. Wang is to be congratulated on writing a very accesible text. The book is thoroughly recommended.' John F. Watts, The Analyst ' ! a very pleasing volume which should attract new users to these techniques.' P. W. Hawkes, Ultramicroscopy ' ! this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide


1. Kinematical electron diffraction; Part I. Diffraction of Reflected Electrons: 2. Reflection high-energy electron diffraction; 3. Dynamical theories of RHEED; 4. Resonance reflections in RHEED; Part II. Imaging of Reflected Electrons: 5. Imaging in TEM; 6. Contrast mechanisms of reflected electron imaging; 7. Applications of UHV REM; 8. Applications of non-UHV REM; Part III. Inelastic Scattering and Spectrometry of Reflected Electrons. 9. Phonon scattering in RHEED; 10. Valence excitation in RHEED; 11. Atomic inner-shell excitations in RHEED; 12. Novel techniques associated with reflection electron imaging. Appendix A: Physical constants, electron wavelengths and wave numbers. Appendix B: Crystal inner potential and atomic scattering factor; Appendix C.1: Crystallographic structure systems; Appendix C.2: FORTRAN program for calculating crystallographic data; Appendix D: Electron diffraction patterns of several types of crystals structures; Appendix E: FORTRAN programs; Appendix F: Bibliography of REM, SREM and REELS. References.

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