Handbook / Manual
By: RJ Keyse, AJ Garratt-Reed, PJ Goodhew and GW Lorimer
114 pages, B/w photos, illus, figs, tabs, SEMs
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About this book
Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanalysis on thin sections of material. The technique is used in many modern transmission electron microscopes and an increasing number of special
Contents
Why STEM? - STEM versus TEM; STEM Optics; The specimen; Imaging in the STEM; Diffraction in the STEM; Microanalysis in the STEM; Mapping in the STEM; Limits to STEM and advanced STEM; Glossary; Further reading; Index
Customer Reviews
Handbook / Manual
By: RJ Keyse, AJ Garratt-Reed, PJ Goodhew and GW Lorimer
114 pages, B/w photos, illus, figs, tabs, SEMs