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Introduction to Scanning Transmission Electron Microscopy

Handbook / Manual

Series: Microscopy Handbooks Volume: 39

By: RJ Keyse, AJ Garratt-Reed, PJ Goodhew and GW Lorimer

114 pages, B/w photos, illus, figs, tabs, SEMs

BIOS Scientific Publishers

Paperback | Dec 1998 | #82272 | ISBN: 1859960669
Availability: Usually dispatched within 6 days Details
NHBS Price: £32.00 $40/€38 approx

About this book

Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanalysis on thin sections of material. The technique is used in many modern transmission electron microscopes and an increasing number of special


Contents

Why STEM? - STEM versus TEM; STEM Optics; The specimen; Imaging in the STEM; Diffraction in the STEM; Microanalysis in the STEM; Mapping in the STEM; Limits to STEM and advanced STEM; Glossary; Further reading; Index

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