Books  Data Analysis & Modelling  Microscopy & Spectroscopy 

Scanning Electron Microscopy

Monograph

Series: Springer Series in Optical Sciences Volume: 45

By: L Reimer

510 pages, 260 figs

Springer-Verlag

Hardback | Dec 1998 | Edition: 2 | #86781 | ISBN: 3540639764
Availability: Usually dispatched within 1-2 weeks Details
NHBS Price: £163.00 $207/€194 approx

About this book

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM. T Mulvey, Measurement Science and Technology. 11, No12, December 2000


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