Edited By: T Sakurai and Watanabe
341 pages, Figs
This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
There are currently no reviews for this product. Be the first to review this product!
Your orders support book donation projects
I have always been MOST impressed by the efficiency, courtesy, integrity and professionalism of NHBS!
Search and browse over 110,000 wildlife and science products
Multi-currency. Secure worldwide shipping
Wildlife, science and conservation since 1985