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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis

By: Ludwig Reimer and Helmut Kohl

615 pages, illus


Hardback | Aug 2008 | Edition: 5 | #175230 | ISBN-13: 9780387400938
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NHBS Price: £119.99 $157/€136 approx

About this book

This text presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.

From the reviews of the fifth edition: "A classical monograph on the physics of image formation, electron-specimen interactions, and image interpretation in transmission electron microscopy. ! the student and the instructor can find applications of many fundamental concepts of physics in this book. ! could be used, of course by scientists in the field of transmission electron microscopy and by students attending a summer school on the technique. ! In conclusion, this book will probably be found in libraries and on the shelves of the expert in transmission electron microscopy ! ." (Gary J. Long, Belgian Physical Society Magazine, Issue 1, 2011)


Particle optics of electrons; wave optics of electrons; elements of a transmission electron microscope; electron-specimen interactions; scattering and phase contrast for amorphous specimens; theory of electron diffraction; electron diffraction modes and applications; imaging of crystalline specimens and their defects; elemental analysis by X-Ray and electron energy-loss spectroscopy; specimen damage by electron irradiation.

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